多轴刀边扫描激光束剖面仪扩展到M²测量
M2Beam-测量仪
M²光束提供分析和图形能力，以测量2轴M²的优点腰尺寸和CW激光器位置。M²系数根据建议的ISO/CD 11 146进行测量。另外，该仪器还测量了沿光束传播轴的交叉点处激光束的轮廓宽度、位置和功率。
M²测量系统与超级波束分析器一起使用™ 头和一个独立的单位。
测量
- Beam Propagation (M²)
- Beam Waist Location
- Beam Waist Diameter
- Divergence
- Rayleigh Range
- Waist Asymmetry
- Astigmatism
规格
| Parameter | Value |
| Spectral Range | 400nm to 1100nm for Si version |
| 800nm to 1800 nm for InGaAs version | |
| 190nm to 1100nm for UV-Enhanced version | |
| Beam Power Range | 100 uW~1W(with supplied internal filters for the Si version) |
| 100uW~5mW for InGaAs&UV versions | |
| Number of Knife-edges | 7 |
| Beam size | 15mm diameter with lens(Si&UV versions) |
| 7mm without lens(Si&UV versions) | |
| 3mm dia./5mm dia.without lens(InGaAs ver) | |
| Maximum Divergence | 10 mrad(no lens) |
| Beam Waist to lens Distance | 2.0 to 2.5 meters optimum |
| 2.0 meters minimum | |
| Weight | 2.5kg(without the Super BeamAnlyzer sensor head) |
| Dimensions | 100×173×415mm |
| Mounting | M6 or 1/4″ screws |
| Mechanical adjustment | Horizontal angle:±1.5° Vertical angle:±1.5° |
| Cable | 2.5m long |
订购信息
Attachment for BeamAnalyzer USB Measurement System:
M2Beam-Si: – attachment for silicon range (350 – 1100nm)
M2Beam-UV: – attachment for silicon range (190 – 1100nm)
M2Beam-IR: – attachment for silicon range (800 – 1800nm)
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